Data Intelligence for Semiconductor Operations
Turning fragmented fab, test, and quality data into continuous insights for faster decision-making and sustained yield improvements.
Value & Features
Contextualize to your organization
Institutional Knowledge Capture
Standardize best-in-class analysis methods and encode expert knowledge into repeatable workflows, ensuring consistency, accelerating onboarding, and preserving organizational know-how.
Seamless Enterprise Integration
Integrates with existing data platforms and ecosystems, including OptimalPlus (NI / Emerson), to maximize value from your current infrastructure.
Continuous learning
Learns and improves over time. Transparent reasoning for traceability.
Accelerate Yield and RCA
Multi-Dimensional Insights
Uncover yield optimization opportunities, process issues, and test efficiency gains through automated correlation across design, manufacturing, test, and reliability data
Interactive reporting and dashboards
Interactive reports which can be exported to PowerPoint, PDF, Word, Excel, etc. Reports can also be pre-built via workflows to included common analyses like RCA
AI Assistant Built for Semiconductors
Ask questions in natural language and receive instant, domain-aware analysis and visualizations—without manually stitching together data from multiple tools
Scale Intelligence
Autonomous 24/7 Monitoring
AI agents continuously monitor all products, fabs, and partners to detect yield excursions and anomalies, automatically surfacing the most critical issues for engineer review
Full Lifecycle & Portfolio Coverage
Monitor hundreds of products across every stage from wafer acceptance and sort through final test and customer returns eliminating blind spots across manufacturing and quality operations
Automatic alerts
Configurable alerts for specific yield thresholds
Core Workflows
Yield Excursion Detection
Detect yield excursions in real-time, identify impacted lots and wafers, and assign severity automatically.
Anomaly Detection
Continuous monitoring for process and test anomalies with automated classification.
Correlation & RCA
Multi-variable correlation analysis to identify root causes of failures and yield loss.
Reporting & Alerts
Automated dashboards, reports, and alerts delivered to the right teams at the right time.
Get in Touch
Ready to accelerate your semiconductor lifecycle? Let's talk.